Rice University

Shared Equipment Authority

Electron Microscopes

Microscope: FEI Helios SEM/FIB

The FEI Helios NanoLab 660 DualBeam system integrates advanced scanning electron microscope (SEM) and focused ion beam (FIB) technologies with plasma cleaner, Gas Injection System (GIS) and the FEI EasyLift NanoManipulator. The FEI Helios NanoLab 660 DualBeam system makes milling, imaging, analysis, and sample preparation easy and efficient.