Rice University

Shared Equipment Authority

X-Ray Diffractometers

The instruments in this facility are capable of performing a number of X-ray Analysis Methods including Powder Phase Analysis, Transmission Small Angle Scattering (particle size and distribution from 1 to 100 NM), Single Crystal Small Molecule Crystal Structure Analysis, Thin Film Thickness Measurement and Surface Phase Analysis, Pole Figure Mapping,  Residual Stress Analysis, Grazing Incidence X-ray Analysis, and High Resolution XRD methods.  

XRD: Rigaku SmartLab XRD

Rigaku SmartLab X-ray Diffractometer (SEA#107) is a multi-purpose X-ray diffractometer with a Cu X-ray Tube, a Theta-Theta Goniometer, a Cross-Beam Optics allowing selection of Parallel-Beam Optics or focusing-beam optics, a Scintillation counter, and several data analysis software for different applications. The instrument is best for thin film analysis, and is capable of conducting a variety of characterization, including:  1) Reflectivity analysis for thin film thickness (1-150 nm), density, and roughness (0-2 nm).