Rigaku SmartLab X-ray Diffractometer (SEA#107) is a multi-purpose X-ray diffractometer with a Cu X-ray Tube, a Theta-Theta Goniometer, a Cross-Beam Optics allowing selection of Parallel-Beam Optics or focusing-beam optics, a Scintillation counter, and several data analysis software for different applications. The instrument is best for thin film analysis, and is capable of conducting a variety of characterization, including: 1) Reflectivity analysis for thin film thickness (1-150 nm), density, and roughness (0-2 nm). Examples of good films include sputtered films, e-beam deposited films, PLA deposited films, CVD deposited films, MBE films etc. 2) Thin film or surface phase analysis using Grazing-incident X-ray diffraction (GIXRD). 3) Nano-scale thin film structural analysis using In-Plane X-ray diffraction. Films as thin as 2 nm can be measured. 4) Texture and preferred (crystal) orientation analysis through Pole Figure and/or Phi-scan. Samples can be thin films, single crystals, or polycrystalline materials. 5) Transmission Small Angle X-ray Scattering (SAXS) for nano-particle/pore size distribution analysis, as well as large d-spacing or periodicity measurement (2- 80 nm). Samples can be powder, suspension, film, or bulk. 6) Residual stress analysis for thin films, metals, ceramics etc. 7) High-resolution Rocking Curves and Reciprocal Space Mapping for crystals, wafers, and epitaxial thin films. Good for crystal quality evaluation, epi-layer strain and composition analysis. 8) Powder phase analysis. Available Software for data analysis includes: 1) GlobalFit: Reflectivity curve fitting; Rocking curve fitting. 2) NanoSolver: Nano-particle/pore size distribution analysis. 3) PDXL: Phase identification; Crystallite size and strain analysis; Lattice constant refinement; Residual stress analysis. 4) 3D Explorer: Pole figure visualization in 3D or 2D; Reciprocal space map visualization in 2D or 3D and in either real space or reciprocal space. Basic Operation Training requires two three-hour sessions. Some XRD methods may require more training than others due to the complexity of instrument configuration.