High-Res imaging, STEM, EDS/EELS, HAADF
Wenhua Guo, firstname.lastname@example.org, ext. 8420 Only experienced TEM users can request training on this instrument.
Must have FOM access to JEOL HC TEM before you can request training on this instrument.
The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic level structural analyses in biology, medicine, and materials sciences as well as the semiconductor and pharmaceutical industries.
The JEM-2100F has been developed to achieve the highest image quality and the highest analytical performance in the 200kV class analytical TEM with a probe size under 0.5nm. The new side-entry goniometer stage provides ease of use tilt, rotation, heating and cooling, programmable multi-point settings--all without mechanical drift. It is equipped with STEM, MDS, EDS, GIF, and CCD-cameras.